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[News] The Medical Grade AFNOR Spec 2311 will be on the conference program of AIMD Day on June 24!

[News] The Medical Grade AFNOR Spec 2311 will be on the conference program of AIMD Day on June 24!

by Raphaëlle Sourice | Apr 30, 2025 | Articles

The conference will be animated by TAME-COMPONENT, Electronic Component Engineering Laboratory, during this day-long international event dedicated to active implantable medical technologies which will take place on June 24, 2025 in Besançon (France). Title:...
RECOME conference at Médi’Nov Connection Lyon 2025

RECOME conference at Médi’Nov Connection Lyon 2025

by Raphaëlle Sourice | Mar 20, 2025 | Articles

[EVENT] We look forward to seeing you at the Medi’Nov Connection trade show in Lyon on Wednesday March 26, 2025 at 2:45 pm 🎤 TAME-COMPONENT, electronic components engineering lab, will host a dedicated conference around the theme “Reliability of electronics for...
[ANNOUNCEMENT] The Medical Grade for electronic components, AFNOR SPEC 2311, has been published!

[ANNOUNCEMENT] The Medical Grade for electronic components, AFNOR SPEC 2311, has been published!

by Raphaëlle Sourice | Mar 17, 2025 | Articles

We are pleased to announce the publication of THE MEDICAL GRADE FOR ELECTRONIC COMPONENTS under the reference AFNOR SPEC 2311 on Monday, 17th of March, 2025, on the AFNOR French standardization body website. AFNOR Spec 2311 normative document – Cover page This...

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by Arnaud Trochet | Jan 24, 2025 | Articles

Predictive Reliability Modelling Based On Combination Of DoE And ALT

Predictive Reliability Modelling Based On Combination Of DoE And ALT

by Laurent SAINTIS | Nov 29, 2024 | Articles

Fatima-Ezahra Indmeskine presented a paper entitled “Predictive Reliability Modelling Based On Combination Of DoE And ALT” at the ESREL 2024 European Safety and Reliability Conference, held in Krakow, Poland, from June 23 to 27, 2024. This work presents the...
Design-of-Experiments and ALT plan for reliability qualification of chip resistors based on mission profile of AIMDs

Design-of-Experiments and ALT plan for reliability qualification of chip resistors based on mission profile of AIMDs

by Laurent SAINTIS | Nov 22, 2024 | Articles

During the ESREF 2024, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, which took place from September 23 to 26, 2024 at Parma in Italy, Fatima-Ezahra Indmeskine presented a paper entitled “Design-of-Experiments and ALT plan for...
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