by Laurent SAINTIS | Mar 23, 2026 | Articles
During the ESREF 2026, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, which took place from October 6 to 9, 2025 at Bordeaux in France, Fatima-Ezahra Indmeskine presented a paper entitled “Reliability assessment of SMD tantalum...
by Raphaëlle Sourice | Sep 7, 2025 | Articles
📅 Mercredi 24 septembre 2025 – ⏰ 14h00 à 16h00 – 💻 En ligne (Teams) – Réservé aux adhérents SNITEM Je m’inscris au webinaire Pourquoi participer à ce webinaire organisé par le Snitem ? La fiabilité des composants électroniques est un enjeu majeur pour les...
by Raphaëlle Sourice | May 30, 2025 | Articles
The conference will be animated by TAME-COMPONENT, Electronic Component Engineering Laboratory, during this day-long international event dedicated to active implantable medical technologies which will take place on June 24, 2025 in Besançon (France). Title:...
by Raphaëlle Sourice | Mar 20, 2025 | Articles
[EVENT] We look forward to seeing you at the Medi’Nov Connection trade show in Lyon on Wednesday March 26, 2025 at 2:45 pm 🎤 TAME-COMPONENT, electronic components engineering lab, will host a dedicated conference around the theme “Reliability of electronics for...
by Raphaëlle Sourice | Mar 17, 2025 | Articles
We are pleased to announce the publication of THE MEDICAL GRADE FOR ELECTRONIC COMPONENTS under the reference AFNOR SPEC 2311 on Monday, 17th of March, 2025, on the AFNOR French standardization body website. AFNOR Spec 2311 normative document – Cover page This...